Forgot your password?
New user?
Nanoparticle fear over anti-odour socks
Fragment-based Lead Discovery Conference 2008
test conference
Document Actions
EMAS 2009 Workshop
11th European Workshop on Modern Developments and Applications in Microbeam Analysis
| Type | Conference |
|---|---|
| Language | English |
| Date |
May 10, 2009
to May 14, 2009 |
| Venue |
Hotel Spa Faltom ul. Grunwaldzka 7 Gdynia/Rumia, Gdansk, PL-84230 PL |
| Chemistry Specialties |
|
| Chemistry Techniques |
|
| Contact |
Michal Zelechower Silesian University of Technology, Department of Materials Science ul. Krasinskiego 8 Katowice, PL-40019 PL +48-32-603.44.747 +48-32-603.44.00 michal.zelechower@ua.ac.be |
| Add event to calendar |
vCal (Windows, Linux)
iCal (Mac OS X)
|
The primary aim of this series of Workshops is to assess the state of the art and reliability of microbeam analysis techniques. The Workshops are organised in such a way as to maximise transfer of knowledge among the participants and to provide a comprehensive exhibition of the latest analytical equipment. The programme allows for adequate time and opportunities for participants to visit the technical exhibitions and hold discussions with the manufacturers. Previous Workshops in this series were held in Antwerp (1989), Dubrovnik (1991), Rimini (1993), St. Malo (1995), Torquay (1997), Konstanz (1999), Tampere (2001), Chiclana de la Frontera (2003), Florence (2005), and Antwerp (2007). They mainly dealt with electron (EPMA, Auger, EELS), ion (SIMS), and nuclear (RBS, NRA) microbeam methods. The main topics the Eleventh Workshop (EMAS 2009) are electron probe microanalysis, micro- and nanoanalysis in the natural resources industry, fast energy-dispersive X-ray spectrometry, electron backscatter diffraction, and three-dimensional microanalysis. Time will also be devoted to problem orientated application of microbeam analysis techniques in fields such as catalysts, composites, glass, sensors, and in cultural heritage, environment, forensics, geology, mineralogy, metallurgy, microelectronics, surfaces and interfaces, etc.