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EMAS 2007

10th European Workshop on Modern Developments and Applications in Microbeam Analysis

Type Conference
Language English
Date May 6, 2007 to
May 10, 2007
Venue Congress Centre 't Elzenveld
Lange Gasthuisstraat 45
Antwerp, BE-2000
BE
Chemistry Specialties
  • analytical chemistry
  • catalysis
  • crystallography
  • earth sciences
  • electronics
  • environmental sciences
  • geochemistry
  • instrumentation and laboratory supplies
  • nuclear chemistry and technology
  • physical sciences
  • solid state chemistry and materials science
  • spectroscopy
Chemistry Techniques
  • crystallography
  • elemental analysis
  • mass spectroscopy
  • microscopy
Contact Luc Van't dack
University of Antwerp, Dept. Chemistry
Campus Drie Eiken, Universiteitsplein 1
Antwerp-Wilrijk, BE-2610
BE
+32-3-8202343
+32-3-8202343
Luc.Vantdack@ua.ac.be
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by Luc Van 't dack last modified 05-01-07 12:07 PM

The primary aim of this series of workshops is to assess the state of the art and reliability of mirobeam analysis techniques. The main topics will be electron probe microanalysis, analytical electron microscopy, scanning electron microscopy, and surface analysis. Time will also be devoted to problem orientated application of microbeam analysis techniques in fields such as catalysts, coatings, composites, glass, sensors, and in cultural heritage, environment, forensics, geology, mineralogy, metallurgy, microelectronics, surfaces and interfaces, etc.

Sponsors

European Microbeam Analysis Society (EMAS) Belgian Society for Microscopy (BVM-SBM)

Speakers

- S.J.B. Reed - C.J.G. van Hoek - D.S. McPhail - G. Gillen - P.G. Kotula - B. Jouffrey - J. Verbeeck - P.D. Nellist - J. Mayer - J. Susini - M. Procop - B. Kanngiesser - M. Haschke - J.F. Watts - I. Joosten - A. De Maeyer-Worobiec - J.P. Krüsemann

Session titles

- Ion beam microanalysis - Recent developments in analytical (S)TEM - X-ray microbeam analysis techniques - Applications of microbeam analysis

More information about this event…

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